Light-trapping in silicon thin-film solar cells measured by Raman spectroscopy and electrical & structural characterization of transparent conductive oxides (TCO) with high lateral resolution are the main topics of cooperation with the photovoltaic laboratory of the Ecole Polytechnigue Federale de Lausanne in Neuchatel (http://www.epfl.ch/). Oral presentation - Light Trapping in Silicon Thin Films Measured by Raman Spectroscopy, as the first result of this collaboration, was given by Martin Ledinsky on the 25th International Conference on Amorphous and Nano-crystalline Semiconductors in Toronto 2013 (http://www.icans25.org/), manuscript is ready to submit.